纳米压痕仪
Nano Indenter G200
型 号:Nano Indenter G200生产厂家:美国Agilent公司主要配置:Standard Indentation head assemblyDCM head assembly (DCM组元)Lateral Force Measurement (水平力测量组元)Nano VisionTM Nanomechanical Microscope Option(纳米观察纳米力学显微镜〕Continuous Stiffness Measurement (CSM)(连续刚度测量组元:CSM技术)压针类型1. Berkovich diamond tip, tip radius 20 nm2. Cube Corner diamond tip,tip radius 20nm3.Conical Diamond Tip, 90 degree angle, 5 micron radius4.Diamond Wedge Tip R<200nm 45 Degree 50micronsContinuous Stiffness Measurement (CSM)(连续刚度测量组元:CSM技术)压针类型1. Berkovich diamond tip, tip radius 20 nm2. Cube Corner diamond tip,tip radius 20nm3.Conical Diamond Tip, 90 degree angle, 5 micron radius4.Diamond Wedge Tip R<200nm 45="" degree="" standard="" indentation="" head="" assemblytotal="" indenter="" 1.5mmmaximum="" mmaximum="" load="" 500mnmaximum="" with="" high="" 10nload="" 50nnload="" f...
用于测量LED光谱功率分布、空间光强分布、电性能测试分析
把Ar气充入离子源放电室并使其电离形成等离子体
主要用于溅射Ti、Al、Ni、Au、Ag、Cr、Pt、Cu、TiW、Pd、Pt、Zn等金属薄膜